In-Line TAM (Test-Access Matrix) Module Family:

Provides a metallic test-access matrix which enables test heads to selectively connect to copper access loops. This flexible solution based on an innovative modular daisy-chain architecture can scale smoothly supporting from 24 lines up to 55,296 lines. It is fully compliant with industry access testing requirements and interoperable with the NCI WMU family of Test units and other widely deployed test heads and relevant OSSs.

In-Line TAM Module: Provides metallic access to up to 24 lines.

TAM Mini-Controller: Controls test head access to up to 32 daisy-chained In-Line TAM Modules providing connectivity to 32 x 24 lines = 768 lines.

TAM Master-Controller: Controls two test head accesses to up to 8 instances of 32 daisy-chained In-Line TAM Modules or 8 x 32 x 24 lines = 6,144 lines. This unit can be further extended to support up to 8 TAM Slave-Controllers, which in turn can each control up to 8 instances of 32 daisy-chained In-Line TAM Modules, to provide test-head access to up to 9 x 6,144 lines = 55,296 lines.

TAM Slave-Controller: Controls two test head accesses to up to 8 instances of 32 daisy-chained In-Line TAM Modules or 8 x 32 x 24 lines = 6,144 lines under the supervision of the TAM Master-Controller.

TAM Shelf: Provide mechanical housing options to rack mount In-Line TAM Modules and TAM Mini-Controllers.

With this flexible line up, the In-Line TAM Module Family can be deployed to service small remote offices supporting a few hundred loops all the way up to much larger central offices with tens of thousands of loops.

  • NEBS Level 3, CE and TL1 Compliant
  • Compatible with all DSLAMS using standard CINC connectors